Barbe, J-C.: search on Z-Library

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1

[IEEE 2015 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) - Washington DC, USA (2015.9.9-2015.9.11)] 2015 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) - Mechanical simulation of stress engineering solutions in highly strained p-type FDSOI MOSFETs for 14-nm node and beyond

Oudrhiri, A. Idrissi-El, Martinie, S., Barbe, J-C., Rozeau, O., Le Royer, C., Jaud, M-A., Lacord, J., Bernier, N., Grenouillet, L., Rivallin, P., Pelloux-Prayer, J., Casse, M., Mouis, M.

Year:

2015

Language:

english

File:

PDF, 625 KB

english, 2015

2

Orientation-Dependent Dewetting of Patterned Thin Si Film on SiO2

Dornel, Erwan, Barbé, J-C., Eymery, J., Crécy, F. de

Journal:

MRS Proceedings

Year:

2006

Language:

english

File:

PDF, 1.17 MB

english, 2006

3

Effect of argon implantation on solid-state dewetting: control of size and surface density of silicon nanocrystals

Almadori, Y, Borowik, Ł, Chevalier, N, Barbé, J-C

Journal:

Year:

2017

Language:

english

File:

PDF, 1008 KB

english, 2017

4

[IEEE 2007 International Conference on Thermal, Mechanical and Multi-Physics Simulation Experiments in Microelectronics and Micro-Systems. EuroSime 2007 - London, UK (2007.04.16-2007.04.18)] 2007 International Conference on Thermal, Mechanical and Multi-Physics Simulation Experiments in Microelectronics and Micro-Systems. EuroSime 2007 - Surface Evolution of Strained Thin Solid Films: Stability Analysis and Time Evolution of Local Surface Perturbations

Dornel, E., Barbe, J-C., Eymery, J., de Crecy, F.

Year:

2007

Language:

english

File:

PDF, 7.50 MB

english, 2007

5

[IEEE 2017 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) - Burlingame, CA, USA (2017.10.16-2017.10.19)] 2017 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) - Z 2 -FET SPICE model: DC and memory operation

Martinie, S., Lacord, J., Rozeau, O., Parihar, M.-S., Lee, Kyunghwa, Bawedin, Maryline, Cristoloveanu, Sorin, Taur, Yuan, Barbe, J-C.

Year:

2017

Language:

english

File:

PDF, 1.16 MB

english, 2017

6

[IEEE 2017 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) - Kamakura, Japan (2017.9.7-2017.9.9)] 2017 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) - Single event transient in bulk MOSFETs: Original modelling for SPICE application

Rostand, N., Martinie, S., Lacord, J., Rozeau, O., Barbe, J-C., Hubert, G.

Year:

2017

Language:

english

File:

PDF, 637 KB

english, 2017

7

[IEEE 2014 14th International Workshop on Junction Technology (IWJT) - Shanghai, China (2014.5.18-2014.5.20)] 2014 International Workshop on Junction Technology (IWJT) - Low temperature junction formation by solid phase epitaxy on thin film devices: Atomistic modeling and experimental achievements

Sklenard, B., Batude, P., Pasini, L., Fenouillet-Beranger, C., Previtali, B., Casse, M., Brunet, L., Rivallin, P., Barbe, J-C., Tavernier, C., Cristoloveanu, S., Vinet, M., Martin-Bragado, I.

Year:

2014

Language:

english

File:

PDF, 607 KB

english, 2014

8

[IEEE 2015 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) - Washington DC, USA (2015.9.9-2015.9.11)] 2015 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) - A physics-based compact model for Fully-Depleted Tunnel Field Effect Transistor

Martinie, S., Rozeau, O., Le Royer, C., Lacord, J., Jaud, M-A., Poiroux, T., Le Carval, G., Barbe, J-C.

Year:

2015

Language:

english

File:

PDF, 646 KB

english, 2015

9

[ECS 210th ECS Meeting - Cancun, Mexico (October 29-November 3, 2006)] ECS Transactions - Nanoscaled MOSFET Transistors on Strained Si, SiGe, Ge Layers: Some Integration and Electrical Properties Features

Ernst, Thomas P., Andrieu, Francois, Weber, O, Hartmann, Jean-Michel, Dupre, C, Faynot, O, Barbe, J-C, Eymery, Joel, Barraud, S, Ducroquet, Frédérique, Ghibaudo, G, Deleonibus, Simon

Year:

2006

Language:

english

File:

PDF, 779 KB

english, 2006

10

Surface diffusion dewetting of thin solid films: Numerical method and application to

Dornel, E., Barbé, J-C., de Crécy, F., Lacolle, G., Eymery, J.

Journal:

Physical Review B

Year:

2006

Language:

english

File:

PDF, 504 KB

english, 2006

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